ASML Ships Multi-Beam Inspection Tool for 5 nm

EVGA Forum Moderator
  • Total Posts : 77958
  • Reward points : 0
  • Joined: 2004/10/05 12:44:35
  • Location: Europe
  • Status: online
  • Ribbons : 71
2020/06/01 22:55:14 (permalink)
ASML Holding NV (ASML) today announced that it has completed system integration and testing of its first-generation HMI multibeam inspection (MBI) system for 5 nm nodes and beyond. The HMI eScan1000 demonstrated successful multibeam operation, simultaneously scanning nine beams on a number of test wafers. With nine beams, the eScan1000 will increase throughput up to 600% compared to single e-beam inspection tools for targeted in-line defect inspection applications.

The new MBI system includes an electron optics system capable of creating and controlling multiple primary electron beamlets and then collecting and processing the resulting secondary electron beams, limiting beam-to-beam crosstalk to less than 2% and delivering consistent imaging quality. It also features a high-speed stage to increase the system's overall throughput and a high-speed computational architecture to process the streams of data from the multiple beamlets in real time.
"As critical dimensions continue to shrink with each new technology, 'killer' defects are becoming smaller and smaller, reaching the point where many are no longer detectable with optical inspection," says Gary Zhang, vice president of HMI Product Marketing at ASML. "Our new multibeam inspection system is able to detect these smaller defects, while addressing previous e-beam throughput constraints to make it more suitable for high-volume manufacturing environments."

By offering a range of beam currents, the eScan1000 is suitable for both physical defect inspection and voltage contrast inspection. This allows customers to target a wide range of defect types both in R&D for process development and high-volume manufacturing for excursion monitoring. Additionally, its proprietary Supernova die-to-database defect detection capability enables chipmakers to monitor for defects on EUV masks using wafer print checks. It detects defects overlooked by optical inspection systems in a fraction of the time that it takes single e-beam solutions for high-volume manufacturing to do so.

The first multibeam inspection system has shipped to a customer this week for qualification. ASML plans to increase the number of beams and beam resolution for future generations to align with chipmakers' product roadmap requirements. 
So my imprerssion is that die sizes are so small than you can't optically detect defects. A new inspection system is required and ASML is the world's leader in this technology. 



Specs: AMD Ryzen 9 3950X,  Corsair MP600 M.2, 64GB Corsair RGB Dominator,  ASUS Crosshair VIII Hero,  Corsair 1000D, EVGA RTX 2070 FTW 3

Associate Code: H5U80QBH6BH0AXF


1 Reply Related Threads

    Cool GTX
    EVGA Forum Moderator
    • Total Posts : 23401
    • Reward points : 0
    • Joined: 2010/12/12 14:22:25
    • Location: Folding for the Greater Good
    • Status: offline
    • Ribbons : 117
    Re: ASML Ships Multi-Beam Inspection Tool for 5 nm 2020/06/02 12:28:22 (permalink)
    magnification, machine learning, lasers ... nothing beats circuit analysis
    That is one fine Toy in the picture

    RTX Project EVGA X99 FTWK-5930K@4.8GHz 2xEVGA2080Ti EVGA-1200P2  Nibbler EVGA X99 Classified-5960X@4.5GHz 3-GPU Water Loop 1600P2 
    AIO Folding  X99 2x1080Ti FTW3 Hybrid, 1200P
    Thank You for Your Support

    Jump to:
  • Back to Mobile